Quantitative measurement of optical surfaces using an improved knife edge
- Author(s):
- Publication title:
- 4th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment
- Title of ser.:
- Proceedings of SPIE - the International Society for Optical Engineering
- Ser. no.:
- 7283
- Pub. Year:
- 2009
- Vol.:
- 1
- Page(from):
- 72830W-1
- Page(to):
- 72830W-5
- Pages:
- 5
- Pub. info.:
- Bellingham, Wash.: Society of Photo-optical Instrumentation Engineers
- ISSN:
- 0277786X
- ISBN:
- 9780819475435 [0819475432]
- Language:
- English
- Call no.:
- P63600/7283
- Type:
- Conference Proceedings
Similar Items:
Society of Photo-optical Instrumentation Engineers |
7
Conference Proceedings
Simultaneous defect inspection on the surface and in the interior of bare wafers using a simple knife-edge test
Society of Photo-optical Instrumentation Engineers |
Society of Photo-optical Instrumentation Engineers |
8
Conference Proceedings
Absorption measurement for coatings using surface thermal lensing technique
SPIE - The International Society of Optical Engineering |
SPIE - The International Society of Optical Engineering |
9
Conference Proceedings
Method for removing temperature shifting during measurement of large mirrors in grinding process
Society of Photo-optical Instrumentation Engineers |
4
Conference Proceedings
Knife-edge test for characterization of subnanometer deformations in micro-optical surfaces
SPIE - The International Society for Optical Engineering |
10
Conference Proceedings
Frame-layer rate control for JVT video coding using improved quadratic rate distortion model [5960-112]
SPIE - The International Society of Optical Engineering |
5
Conference Proceedings
Measurement of deep modulation index of M-Z electro-optic modulator by using optical spectrum analyzer
SPIE-The International Society for Optical Engineering |
11
Conference Proceedings
Wafer Edge and Interferometry Limitations in Low Open Area Etch Endpoint Detection using Optical Emission Spectroscopy
Electrochemical Society |
Society of Photo-optical Instrumentation Engineers |
Society of Photo-optical Instrumentation Engineers |