Effects of thickness and substrate temperature on the electrical and optical properties of In2O3-Zn0 films

Effects of thickness and substrate temperature on the electrical and optical properties of In₂O₃-Zn0 films

Author(s):

Y. Pei ( Fujian Normal Univ., China )
F. Lai ( Fujian Normal Univ., China )
L. Lin ( Fujian Normal Univ., China )
L. Fan ( Fujian Normal Univ., China )
Y. Qu ( Fujian Normal Univ., China )

Publication title:

4th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Advanced Optical Manufacturing Technologies

Title of ser.:

Proceedings of SPIE - the International Society for Optical Engineering

Ser. no.:

7282

Pub. Year:

2009

Vol.:

1

Page(from):

728215-1

Page(to):

728215-6

Pages:

6

Pub. info.:

Bellingham, Wash.: Society of Photo-optical Instrumentation Engineers

ISSN:

0277786X

ISBN:

9780819475428 [0819475424]

Language:

English

Call no.:

P63600/7282

Type:

Conference Proceedings

Details

TDL ID:	ZA00052803
Series ID:	PA00000029
Conf. info. (Name):	International Symposium on Advanced Optical Manufacturing and Testing Technologies
Conf. info. (Number):	2008 : 4th
Conf. info. (Venue):	Chengdu, China
Conf. info. (Date):	2008.11.19-2008.11.21
Note for article:	4th International Symposium on Advanced Optical Manufacturing and Testing Technologies, 19-21 November 2008, Chengdu, China - Poster Session, 728215, 7282-40

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