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Noise analysis for infrared focal plane arrays CMOS readout integrated circuit

Author(s):
  • J. Lin ( Shanghai Institute of Technical Physics, China )
  • R. Ding ( Shanghai Institute of Technical Physics, China )
  • H. Chen ( Shanghai Institute of Technical Physics, China )
  • X. Shen ( Shanghai Institute of Technical Physics, China )
  • F. Liu ( Shanghai Institute of Technical Physics, China )
Publication title:
Microelectronic and optoelectronic devices and integration : 2008 International Conference on Optical Instruments and Technology : 16-19 November 2008, Beijing, China
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:
7158
Pub. Year:
2009
Page(from):
71580C-1
Page(to):
71580C-8
Pages:
8
Pub. info.:
Bellingham, Wash.: Society of Photo-optical Instrumentation Engineers
ISSN:
0277786X
ISBN:
9780819474025 [0819474029]
Language:
English
Call no.:
P63600/7158
Type:
Conference Proceedings

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