A front-end ASIC design for non-uniformity correction
- Author(s):
- X. Shen ( Shanghai Institute of Technical Physics, China )
- R. J. Ding ( Shanghai Institute of Technical Physics, China )
- J. M. Lin ( Shanghai Institute of Technical Physics, China )
- F. Liu ( Shanghai Institute of Technical Physics, China )
- Publication title:
- 2008 International Conference on Optical Instruments and Technology: Optical Systems and Optoelectronic Instruments
- Title of ser.:
- Proceedings of SPIE - the International Society for Optical Engineering
- Ser. no.:
- 7156
- Pub. Year:
- 2008
- Vol.:
- 2
- Page(from):
- 71561U-1
- Page(to):
- 71561U-8
- Pages:
- 8
- Pub. info.:
- Bellingham, Wash.: Society of Photo-optical Instrumentation Engineers
- ISSN:
- 0277786X
- ISBN:
- 9780819474001 [0819474002]
- Language:
- English
- Call no.:
- P63600/7156
- Type:
- Conference Proceedings
Similar Items:
1
Conference Proceedings
Noise analysis for infrared focal plane arrays CMOS readout integrated circuit
Society of Photo-optical Instrumentation Engineers |
SPIE - The International Society of Optical Engineering |
2
Conference Proceedings
256×1 readout integrated circuit with simultaneous integration mode for two-color infrared detectors
Society of Photo-optical Instrumentation Engineers |
Society of Photo-optical Instrumentation Engineers |
SPIE - The International Society of Optical Engineering |
SPIE - The International Society of Optical Engineering |
ESA Publications Division |
Trans Tech Publications |
MRS - Materials Research Society |
11
Conference Proceedings
CCD-based system for two-dimensional measurement of color uniformity of LCD projector
SPIE - The International Society of Optical Engineering |
6
Conference Proceedings
Impact of RF Front-End Non-Idealities on Performances of SIMO-OFDM Receiver
ESA Publications Division |
SPIE - The International Society of Optical Engineering |