Surface measurement with Shack-Hartmann wavefront sensing technology
- Author(s):
- X. Li ( Singapore Institute of Manufacturing Technology, Singapore )
- L. P. Zhao ( Singapore Institute of Manufacturing Technology, Singapore )
- Z. P. Fang ( Singapore Institute of Manufacturing Technology, Singapore )
- A. Asundi ( Nanyang Technological Univ., Singapore )
- X. M. Yin ( Nanyang Technological Univ., Singapore )
- Publication title:
- Ninth International Symposium on Laser Metrology
- Title of ser.:
- Proceedings of SPIE - the International Society for Optical Engineering
- Ser. no.:
- 7155
- Pub. Year:
- 2008
- Vol.:
- 1
- Page(from):
- 715515-1
- Page(to):
- 715515-9
- Pages:
- 9
- Pub. info.:
- Bellingham, Wash.: Society of Photo-optical Instrumentation Engineers
- ISSN:
- 0277786X
- ISBN:
- 9780819473981 [0819473987]
- Language:
- English
- Call no.:
- P63600/7155
- Type:
- Conference Proceedings
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