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Thermal expansion coefficient and electrical resistivity of nonuniform temperature specimen

Author(s):
  • C. Xin ( Harbin Institute of Technology, China )
  • J. Dai ( Harbin Institute of Technology, China )
  • Q. Wang ( Harbin Institute of Technology, China )
  • X. He ( Aerospace Research Institute of Materials and Processing Technology, China )
Publication title:
Fifth International Symposium on Instrumentation Science and Technology
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:
7133
Pub. Year:
2008
Vol.:
2
Page(from):
71333F-1
Page(to):
71333F-7
Pages:
7
Pub. info.:
Bellingham, Wash.: Society of Photo-optical Instrumentation Engineers
ISSN:
0277786X
ISBN:
9780819473677 [0819473677]
Language:
English
Call no.:
P63600/7133
Type:
Conference Proceedings

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