Blank Cover Image

Statistical interpretation of S-on-1 data and the damage initiation mechanism

Author(s):
  • F. R. Wagner ( Institut Fresnel, CNRS,Aix-Marseille Univ., France )
  • A. Hildenbrand ( Institut Fresnel, CNRS,Aix-Marseille Univ., France )
  • L. Gallais ( Institut Fresnel, CNRS,Aix-Marseille Univ., France )
  • H. Akhouayri ( Institut Fresnel, CNRS,Aix-Marseille Univ., France )
  • M. Commandre ( Institut Fresnel, CNRS,Aix-Marseille Univ., France )
Publication title:
Laser-Induced Damage in Optical Materials: 2008
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:
7132
Pub. Year:
2008
Page(from):
71320Y-1
Page(to):
71320Y-9
Pages:
9
Pub. info.:
Bellingham, Wash.: Society of Photo-optical Instrumentation Engineers
ISSN:
0277786X
ISBN:
9780819473660 [0819473669]
Language:
English
Call no.:
P63600/7132
Type:
Conference Proceedings

Similar Items:

A. Hildenbrand, F. R. Wagner, H. Akhouayri, J.-Y. Natoli, M. Commandre

Society of Photo-optical Instrumentation Engineers

Krol, H., Gallais, L., Natoli, J. -Y., Grezes-Besset, C., Commandre, M.

SPIE - The International Society of Optical Engineering

A. Hildenbrand, F. R. Wagner, J. -Y. Natoli, M. Commandré, H. Albrecht

Society of Photo-optical Instrumentation Engineers

Krol, H., Gallais, L., Bertussi, B., Natoli, J.-Y., Grezes-Besset, C., Commandre, M., Amra, C.

SPIE - The International Society of Optical Engineering

F. R. Wagner, A. Hildenbrand, J.-Y. Natoli, M. Commandre, F. Theodore

Society of Photo-optical Instrumentation Engineers

L. Gallais, J. Capoulade, J.-Y. Natoli, M. Commandré, M. Cathelinaud

Society of Photo-optical Instrumentation Engineers

Gallias, L., Capoulade, J., Wagner, F., Krol, H., Natoli, J. -Y., Commandre, M., Kurbanov, S.

SPIE - The International Society of Optical Engineering

Billard, F., Commandre, M., Amra, C., Natoli, J.-Y., Akhouayri, H.

SPIE - The International Society of Optical Engineering

Natoli,J.Y., Gallais,L., Akhouayri,H., Amra,C.

SPIE-The International Society for Optical Engineering

Bertussi, B., Natoli, J.-Y., During, A., Commandre, M., Gallais, L., Rullier, J.L., Bercegol, H., Bouchut, P.

SPIE - The International Society of Optical Engineering

Feit,M.D., Genin,F.Y., Rubenchik,A.M., Sheehan,L.M., Schwartz,S., Kozlowski,M.R., Dijon,J., Garrec,P., Hue,J.

SPIE - The International Society for Optical Engineering

Gallais, L., Hinsch, H., Lay, M.-L., Commandre, M.

SPIE - The International Society of Optical Engineering

1
 
2
 
3
 
4
 
5
 
6
 
7
 
8
 
9
 
10
 
11
 
12