Analysis of key technologies for virtual instruments metrology

Author(s):

• G. Liu ( South China Univ. of Technology, China )
• Q. Xu ( South China Univ. of Technology, China )
• F. Gao ( Guangdong Institute of Metrology, China )
• Q. Guan ( South China Univ. of Technology, China )
• Q. Fang ( Guangdong Institute of Metrology, China )

Publication title:

Fourth International Symposium on Precision Mechanical Measurements

Title of ser.:

Proceedings of SPIE - the International Society for Optical Engineering

Ser. no.:

7130

Pub. Year:

2008

Vol.:

2

Page(from):

71305B-1

Page(to):

71305B-6

Pages:

6

Pub. info.:

Bellingham, Wash.: Society of Photo-optical Instrumentation Engineers

ISSN:

0277786X

ISBN:

9780819473646 [0819473642]

Language:

English

Call no.:

P63600/7130

Type:

Conference Proceedings