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Dynamic error modeling of CMM based on Bayesian statistical principle

Author(s):
  • H. Yang ( Anhui Univ. of Science & Technology, China )
  • S.-W. Lin ( Far East Univ., Taiwan,China )
  • Y. Fei ( Hefei Univ. of Technology, China )
  • L. Sheng ( Hefei Univ. of Technology, China )
  • Z. Cheng ( Hefei Univ. of Technology, China )
Publication title:
Fourth International Symposium on Precision Mechanical Measurements
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:
7130
Pub. Year:
2008
Vol.:
1
Page(from):
71300H-1
Page(to):
71300H-7
Pages:
7
Pub. info.:
Bellingham, Wash.: Society of Photo-optical Instrumentation Engineers
ISSN:
0277786X
ISBN:
9780819473646 [0819473642]
Language:
English
Call no.:
P63600/7130
Type:
Conference Proceedings

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