A simple system for measuring small phase retardation of an optical thin fil

A simple system for measuring small phase retardation of an optical thin fil

Author(s):

T. N. Hansen ( DELTA Light & Optics, Denmark )
H. Fabricius ( DELTA Light & Optics, Denmark )

Publication title:

Advances in optical thin films III : 2-3 September 2008, Glasgow, United Kingdom

Title of ser.:

Proceedings of SPIE - the International Society for Optical Engineering

Ser. no.:

7101

Pub. Year:

2008

Page(from):

71011H-1

Page(to):

71011H-7

Pages:

7

Pub. info.:

Bellingham, Wash.: Society of Photo-optical Instrumentation Engineers

ISSN:

0277786X

ISBN:

9780819473318 [0819473316]

Language:

English

Call no.:

P63600/7101

Type:

Conference Proceedings

Details

TDL ID:	ZA00052732
Series ID:	PA00000029
Conf. info. (Name):	SPIE Optical Systems Design : Advances in Optical Thin Films
Conf. info. (Number):	2008 : 3rd
Conf. info. (Venue):	Glasgow, United Kingdom
Conf. info. (Date):	2008.09.02-2008.09.03
Note for article:	Advances in optical thin films III, 2-3 September 2008, Glasgow, United Kingdom - Poster Session, 71011H, 7101-57

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