Measurement of optical constants of thin films by non conventional ellipsometry, photothermal deflection specfroscopy, and plasmon resonance spectroscopy

Measurement of optical constants of thin films by non conventional ellipsometry, photothermal deflection specfroscopy, and plasmon resonance spectroscopy

Author(s):: A. Krasilnikova Sytchkova ( ENEA, Italy )
Publication title:: Advances in optical thin films III : 2-3 September 2008, Glasgow, United Kingdom
Title of ser.:: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:: 7101
Pub. Year:: 2008
Page(from):: 71010R-1
Page(to):: 71010R-13
Pages:: 13
Pub. info.:: Bellingham, Wash.: Society of Photo-optical Instrumentation Engineers
ISSN:: 0277786X
ISBN:: 9780819473318 [0819473316]
Language:: English
Call no.:: P63600/7101
Type:: Conference Proceedings

Details

TDL ID:	ZA00052732
Series ID:	PA00000029
Conf. info. (Name):	SPIE Optical Systems Design : Advances in Optical Thin Films
Conf. info. (Number):	2008 : 3rd
Conf. info. (Venue):	Glasgow, United Kingdom
Conf. info. (Date):	2008.09.02-2008.09.03
Note for article:	Advances in optical thin films III, 2-3 September 2008, Glasgow, United Kingdom - Session 6. Characterisation, Invited paper, 71010R, 7101-29

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