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A mammography imaging hybrid pixel sensor test chip with low-noise CMOS readout IC on fully depleted silicon-on-insulator design

Author(s):
Publication title:
Penetrating radiation systems and applications IX : 13-14 August 2008, San Diego, California, USA
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:
7080
Pub. Year:
2008
Page(from):
708009-1
Page(to):
708009-11
Pages:
11
Pub. info.:
Bellingham, Wash.: Society of Photo-optical Instrumentation Engineers
ISSN:
0277786X
ISBN:
9780819473004 [0819473006]
Language:
English
Call no.:
P63600/7080
Type:
Conference Proceedings

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