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Defect measurements of CdZnTe detectors using I-DLTS, TCT, I-V, C-V and y-ray spectroscopy

Author(s):
  • R. Gul ( Brookhaven National Lab., United States )
  • Z. Li ( Brookhaven National Lab., United States )
  • R. Rodriguez ( Idaho State Univ., United States )
  • K. Keeter ( Idaho State Univ., United States )
  • A. Bolotnikov ( Brookhaven National Lab., United States )
Publication title:
Hard X-ray, gamma-ray, and neutron detector physics X : 11-13 August 2008, San Diego, California, USA
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:
7079
Pub. Year:
2008
Page(from):
70790U-1
Page(to):
70790U-8
Pages:
8
Pub. info.:
Bellingham, Wash.: Society of Photo-optical Instrumentation Engineers
ISSN:
0277786X
ISBN:
9780819472991 [0819472999]
Language:
English
Call no.:
P63600/7079
Type:
Conference Proceedings

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