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3D profile measurement of large-scale curvature plates using structured light source

Author(s):
  • E. Heo ( Kyungnam Univ., South Korea )
  • B. Kim ( Kyungnam Univ., South Korea )
  • H. Lee ( DAEWOO Shipbuilding & Marine Engineering Co. Ltd, South Korea )
  • J. Han ( DAEWOO Shipbuilding & Marine Engineering Co. Ltd, South Korea )
Publication title:
Two- and three-dimensional methods for inspection and metrology VI : 10-11 August 2008, San Diego, California, USA
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:
7066
Pub. Year:
2008
Page(from):
70660O-1
Page(to):
70660O-8
Pages:
8
Pub. info.:
Bellingham, Wash.: Society of Photo-optical Instrumentation Engineers
ISSN:
0277786X
ISBN:
9780819472861 [0819472867]
Language:
English
Call no.:
P63600/7066
Type:
Conference Proceedings

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