Blank Cover Image

New algorithms and error analysis for sinusoidal phase shifting interferometry

Author(s):
Publication title:
Interferometry XIV : techniques and analysis : 11-13 August 2008, San Diego, California, USA
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:
7063
Pub. Year:
2008
Page(from):
70630K-1
Page(to):
70630K-14
Pages:
14
Pub. info.:
Bellingham, Wash.: Society of Photo-optical Instrumentation Engineers
ISSN:
0277786X
ISBN:
9780819472830 [0819472832]
Language:
English
Call no.:
P63600/7063
Type:
Conference Proceedings

Similar Items:

de Groot,P.

SPIE-The International Society for Optical Engineering

L. L. Deck

Society of Photo-optical Instrumentation Engineers

Wang, J., Pressesky, J.L.

SPIE - The International Society of Optical Engineering

G. He, M. Wu, S. Liu, L. Deng

Society of Photo-optical Instrumentation Engineers

Hui,M., Niu,H., Li,Q.

SPIE-The International Society for Optical Engineering

T. Korhonen, P. Keinanen, M. Pasanen, A. Sillanpaa

Society of Photo-optical Instrumentation Engineers

Gushov, V.I., Iliynykh, S.P.

SPIE-The International Society for Optical Engineering

Adachi M.

SPIE - The International Society of Optical Engineering

Guo,H., Chen,M., Wei,C.

SPIE - The International Society for Optical Engineering

Ruiz, P.D., Kaufmann, G.H., Huntley, J.M.

SPIE-The International Society for Optical Engineering

Hariharan,P., Pryputniewicz,E.J., Pryputniewicz,R.J.

SPIE - The International Society for Optical Engineering

de Groot, P.J.

SPIE-The International Society for Optical Engineering

1
 
2
 
3
 
4
 
5
 
6
 
7
 
8
 
9
 
10
 
11
 
12