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Comparative SIMS and US-LSNMS analysis of Cu/Ti multilayer thin films

Author(s):
Publication title:
15th International School on Quantum Electronics : laser physics and applications : 15-19 September, 2008, Bourgas, Bulgaria
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:
7027
Pub. Year:
2008
Page(from):
702706-1
Page(to):
702706-8
Pages:
8
Pub. info.:
Bellingham, Wash.: Society of Photo-optical Instrumentation Engineers
ISSN:
0277786X
ISBN:
9780819472410 [0819472417]
Language:
English
Call no.:
P63600/7027
Type:
Conference Proceedings

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