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Reflective interferometer for investigation of amplitude-phase characteristics of semiconductor nanostructures

Author(s):
Publication title:
International Workshop on Quantum Optics 2007 : 18-22 September 2007, Samara, Russia
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:
7024
Pub. Year:
2008
Page(from):
70240N-1
Page(to):
70240N-6
Pages:
6
Pub. info.:
Bellingham, Wash.: Society of Photo-optical Instrumentation Engineers
ISSN:
0277786X
ISBN:
9780819472373 [0819472379]
Language:
English
Call no.:
P63600/7024
Type:
Conference Proceedings

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