A magnetic diverter for charged particle background rejection In the SIMBOL-X telescope
- Author(s):
- D. Spiga ( INAF, Osservatorio Astronomico di Brera, Italy )
- V. Fioretti ( INAF, Istituto di Astrofisica Spaziale e Fisica Cosmica, Italy )
- A. Bulgarelli ( INAF, Istituto di Astrofisica Spaziale e Fisica Cosmica, Italy )
- E. Dell'Orto ( INAF, Osservatorio Astronomico di Brera, Italy )
- L. Foschini ( INAF, Istituto di Astrofisica Spaziale e Fisica Cosmica, Italy )
- Publication title:
- Space telescopes and instrumentation 2008 : ultraviolet to gamma ray : 23-28 June 2008, Marseille, France
- Title of ser.:
- Proceedings of SPIE - the International Society for Optical Engineering
- Ser. no.:
- 7011
- Pub. Year:
- 2008
- Vol.:
- 2
- Page(from):
- 70112Y-1
- Page(to):
- 70112Y-11
- Pages:
- 11
- Pub. info.:
- Bellingham, Wash.: Society of Photo-optical Instrumentation Engineers
- ISSN:
- 0277786X
- ISBN:
- 9780819472212 [0819472212]
- Language:
- English
- Call no.:
- P63600/7011
- Type:
- Conference Proceedings
Similar Items:
1
Conference Proceedings
Optical module HEW simulations for the x-ray telescopes SIMBOL-X, EDGE and XEUS
Society of Photo-optical Instrumentation Engineers |
7
Conference Proceedings
Surface roughness evaluation on mandrels and mirror shells for future X-ray telescopes
Society of Photo-optical Instrumentation Engineers |
IOS Press |
ESA Publications Division |
3
Conference Proceedings
SIMBOL-X: the problem of calibrating a 0.5-80 keV 20m focal length focussing telescope
Society of Photo-optical Instrumentation Engineers |
ESA Publications Division |
SPIE-The International Society for Optical Engineering |
Society of Automotive Engineers |
Society of Automotive Engineers |
SPIE - The International Society of Optical Engineering |
Society of Automotive Engineers |
12
Conference Proceedings
HEW simulations and quantification of the microroughness requirements for x-ray telescopes by means of numerical and analytical methods
Society of Photo-optical Instrumentation Engineers |