Pico meter metrology for the GAIA mission

Pico meter metrology for the GAIA mission

Author(s):

E. A. Meijer ( TNO Science and Industry, Netherlands )
J. N. Nijenhuis ( TNO Science and Industry, Netherlands )
R. J. P. Vink ( TNO Science and Industry, Netherlands )
F. Kamphues ( TNO Science and Industry, Netherlands )

Publication title:

Space telescopes and instrumentation 2008 : optical, infrared, and millimeter : 23-28 June 2008, Marseille, France

Title of ser.:

Proceedings of SPIE - the International Society for Optical Engineering

Ser. no.:

7010

Pub. Year:

2008

Vol.:

2

Page(from):

70102O-1

Page(to):

70102O-10

Pages:

10

Pub. info.:

Bellingham, Wash.: Society of Photo-optical Instrumentation Engineers

ISSN:

0277786X

ISBN:

9780819472205 [0819472204]

Language:

English

Call no.:

P63600/7010

Type:

Conference Proceedings

Details

TDL ID:	ZA00052641
Series ID:	PA00000029
Conf. info. (Name):	Astronomical Telescopes and Instrumentation : Space Telescopes and Instrumentation
Conf. info. (Number):	2008
Conf. info. (Venue):	Marseille, France
Conf. info. (Date):	2008.06.23-2008.06.28
Note for article:	Space telescopes and instrumentation 2008, 23-28 June 2008, Marseille, France - Technologies: Instruments, 70102O, 7010-97

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