Quantitative phase restoration in differential interference contrast (DIC) microscopy
- Author(s):
- S. S. Kou ( National Univ. of Singapore, Singapore )
- C. J. R. Sheppard ( National Univ. of Singapore, Singapore )
- Publication title:
- Optical and digital image processing : 7-9 April 2008, Strasbourg, France
- Title of ser.:
- Proceedings of SPIE - the International Society for Optical Engineering
- Ser. no.:
- 7000
- Pub. Year:
- 2008
- Page(from):
- 700005-1
- Page(to):
- 700005-8
- Pages:
- 8
- Pub. info.:
- Bellingham, Wash.: Society of Photo-optical Instrumentation Engineers
- ISSN:
- 0277786X
- ISBN:
- 9780819471987 [0819471984]
- Language:
- English
- Call no.:
- P63600/7000
- Type:
- Conference Proceedings
Similar Items:
1
Conference Proceedings
Alternating minimization algorithm for quantitative differential-interference contrast (DIC) microscopy
Society of Photo-optical Instrumentation Engineers |
7
Conference Proceedings
Quantitative phase analysis in retardation-modulated differential interference contrast(RM-DIC)microscope
SPIE - The International Society for Optical Engineering |
2
Conference Proceedings
Quantitative orientation-independent differential interference contrast (DIC) microscopy
SPIE - The International Society of Optical Engineering |
8
Conference Proceedings
Calibration of a phase-shifting DIC microscope for quantitative phase imaging
SPIE - The International Society of Optical Engineering |
3
Conference Proceedings
Quantitative determination of specimen properties using computational differential-interference contrast (DIC) microscopy
SPIE - The International Society of Optical Engineering |
9
Conference Proceedings
Geometric phase low-coherence interference microscopy at high numerical apertures
SPIE-The International Society for Optical Engineering |
4
Conference Proceedings
Comparison of three dimensional transfer function analysis of alternative phase imaging methods
SPIE - The International Society of Optical Engineering |
10
Conference Proceedings
On-chip differential interference contrast (DIC) phase imager and beam profiler based on Young's interference
SPIE - The International Society of Optical Engineering |
SPIE-The International Society for Optical Engineering |
SPIE - The International Society for Optical Engineering |
SPIE-The International Society for Optical Engineering |
SPIE-The International Society for Optical Engineering |