Polarization measurements made on LFRA and OASIS emitter arrays

Polarization measurements made on LFRA and OASIS emitter arrays

Author(s):

J. Geske ( Aerius Photonics, LLC, USA )
K. Sparkman ( Santa Barbara Infrared, Inc., USA )
J. Oleson ( Santa Barbara Infrared, Inc., USA )
J. Laveigne ( Santa Barbara Infrared, Inc., USA )
B. Sieglinger ( MacAulay-Brown lnc./KHILS, USA )

Publication title:

Technologies for synthetic environments : hardware-in-the-loop testing XIII : 17-18 March 2008, Orlando, Florida, USA

Title of ser.:

Proceedings of SPIE - the International Society for Optical Engineering

Ser. no.:

6942

Pub. Year:

2008

Page(from):

69420L-1

Page(to):

69420L-11

Pages:

11

Pub. info.:

Bellingham, Wash.: Society of Photo-optical Instrumentation Engineers

ISSN:

0277786X

ISBN:

9780819471338 [081947133X]

Language:

English

Call no.:

P63600/6942

Type:

Conference Proceedings

Details

TDL ID:	ZA00052573
Series ID:	PA00000029
Conf. info. (Name):	Defense, Security, and Sensing : Technologies for Synthetic Environments: Hardware-in-the-Loop Testing
Conf. info. (Number):	2008 : 13th
Conf. info. (Venue):	Orlando, Florida, USA
Conf. info. (Date):	2008.03.17-2008.03.18
Note for article:	Technologies for synthetic environments: Hardware-in-the-Loop Testing XIII, Orlando, Florida, USA, 17-18 March 2008. Session 5. Scene Generation Technologies, 69420L, 6942-28

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