Blank Cover Image

Physics based modeling for time-frequency damage classification

Author(s):
Publication title:
Modeling, signal processing, and control for smart structures 2008 : 10-12 March 2008, San Diego, California, USA
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:
6926
Pub. Year:
2008
Page(from):
69260M-1
Page(to):
69260M-12
Pages:
12
Pub. info.:
Bellingham, Wash.: Society of Photo-optical Instrumentation Engineers
ISSN:
0277786X
ISBN:
9780819471123 [0819471127]
Language:
English
Call no.:
P63600/6926
Type:
Conference Proceedings

Similar Items:

N. Kovvali, S. Das, D. Chakraborty, D. Cochran, A. Papandreou-Suppappola, A. Chattopadhyay

American Institute of Aeronautics and Astronautics

7 Conference Proceedings Time-frequency-based classification

Tacer,B., Loughlin,P.J.

SPIE-The International Society for Optical Engineering

W. Zhou, N. Kovvali, A. Papandreou-Suppappola, D. Cochran, A. Chattopadhyay

SPIE - The International Society of Optical Engineering

C. K. Coelho, S. Das, A. Chattopadhyay, A. Papandreou-Suppappola, P. Peralta

SPIE - The International Society of Optical Engineering

L. Channels, D. Chakraborty, D. Simon, N. Kovvali, J. Spicer

Society of Photo-optical Instrumentation Engineers

Bourdarie, S., Boscher, D., Beutier, T., Sauvaud, J.-A., Blanc, M., Friedel, R.

ESA Publications Division

S. Das, I. Kyriakides, A. Chattopadhyay, A. Papandreou-Suppappola

American Institute of Aeronautics and Astronautics

S. Soni, B. Gurumoorthy

American Society of Mechanical Engineers

W. Zhou, W. D. Reynolds, A. Moncada, N. Kovvali, A. Chattopadhyay

Society of Photo-optical Instrumentation Engineers

M. De Grazia, H. Merdji, B. Carre, J. Gaudin, G. Geoffroy, S. Guizard, N. Fedorov, A. Belsky, P. Martin, M. Kirm, V. …

SPIE - The International Society of Optical Engineering

Das, S., Papandreou-Suppappola, A., Zhou, X., Chattopadhyay, A.

SPIE - The International Society of Optical Engineering

12 Conference Proceedings Model-based time-frequency analysis

Qian,S., Chen,V.C.

SPIE - The International Society for Optical Engineering

1
 
2
 
3
 
4
 
5
 
6
 
7
 
8
 
9
 
10
 
11
 
12