Impact of gate line edge roughness on double-gate FinFET performance variability
- Author(s):
- K. Patel ( SanDisk Inc., USA )
- T.-J. King Liu ( Univ. of California, Berkeley, USA )
- C. Spanos ( Univ. of California, Berkeley, USA )
- Publication title:
- Design for manufacturability through design-process integration II : 28-29 February 2008, San Jose, California, USA
- Title of ser.:
- Proceedings of SPIE - the International Society for Optical Engineering
- Ser. no.:
- 6925
- Pub. Year:
- 2008
- Page(from):
- 69251I-1
- Page(to):
- 69251I-10
- Pages:
- 10
- Pub. info.:
- Bellingham, Wash.: Society of Photo-optical Instrumentation Engineers
- ISSN:
- 0277786X
- ISBN:
- 9780819471109 [0819471100]
- Language:
- English
- Call no.:
- P63600/6925
- Type:
- Conference Proceedings
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