Interface roughness estimate from carrier transport in InAs/GaSb superlattices

Interface roughness estimate from carrier transport in InAs/GaSb superlattices

Author(s):

F. Szmulowicz ( Univ. of Dayton Research Institute, USA )
S. Elhamri ( Univ. of Dayton, USA )
H. J. Haugan ( Universal Technology Corp., USA )
G. J. Brown ( Air Force Research Lab., USA )
W. C. Mitchel ( Air Force Research Lab., USA )

Publication title:

Quantum sensing and nanophotonic devices V : 20-23 January 2008, San Jose, California, USA

Title of ser.:

Proceedings of SPIE - the International Society for Optical Engineering

Ser. no.:

6900

Pub. Year:

2008

Page(from):

69000P-1

Page(to):

69000P-9

Pages:

9

Pub. info.:

Bellingham, Wash.: Society of Photo-optical Instrumentation Engineers

ISSN:

0277786X

ISBN:

9780819470751 [0819470759]

Language:

English

Call no.:

P63600/6900

Type:

Conference Proceedings

Details

TDL ID:	ZA00052531
Series ID:	PA00000029
Conf. info. (Name):	Photonics West - Optoelectronic Materials and Devices : Quantum Sensing and Nanophotonic Devices
Conf. info. (Number):	2008 : 5th
Conf. info. (Venue):	San Jose, California, USA
Conf. info. (Date):	2008.01.20-2008.01.23
Note for article:	Quantum sensing and nanophotonic devices V, 20-23 January 2008, San Jose, California, USA - Session 6. Superlattices and Quantum Detectors III (69000P/6900-23)

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