Blank Cover Image

Tip-enhanced near-field Raman spectroscopy using a scanning tunneling microscope with side illumination optics

Author(s):
  • K. J. Yi ( Univ. of Nebraska-Lincoln, USA )
  • X. N. He ( Univ. of Nebraska-Lincoln, USA )
  • Y. F. Lu ( Univ. of Nebraska-Lincoln, USA )
Publication title:
Laser-based micro- and nanopackaging and assembly II : 22-24 January 2008, San Jose, California, USA
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:
6880
Pub. Year:
2008
Page(from):
688006-1
Page(to):
688006-11
Pages:
11
Pub. info.:
Bellingham, Wash.: Society of Photo-optical Instrumentation Engineers
ISSN:
0277786X
ISBN:
9780819470553 [0819470554]
Language:
English
Call no.:
P63600/6880
Type:
Conference Proceedings

Similar Items:

1 Conference Proceedings Near-field scanning optical microscope using a metallized cantilever tip for nanospectroscopy

Inouye,Y., Hayazawa,N., Hayashi,K., Sekkat,Z., kawata,S.

SPIE - The International Society for Optical Engineering
7 Conference Proceedings The Tetrahedral Tip as a Probe for Scanning Near-Field Optical and for Scanning Tunneling Microscopy

Koglin J., Fischer C. U., Brzoska D. K., Gohde W., Fuchs H.

Kluwer Academic Publishers
2 Conference Proceedings Tip-enhanced near-field Raman spectroscopy applied to nano-composite materials

Y. Saito, K. Yanagi, N. Hayazawa, H. Kataura, S. Kawata

Society of Photo-optical Instrumentation Engineers
8 Conference Proceedings Optical integrated waveguides characterization by scanning near-field optical microscope

Borrise, X., Barniol, N., Perez-Murano, F., Abadal, G., Aymerich, X., Jimenez, D.

MRS-Materials Research Society
3 Conference Proceedings "Combined Photon Scanning Tunneling Microscope and Atomic Force Microscope using Silicon Nitrde Tips"

Moers P. H. M., Tack G. R., Noordman J. F. O., Segerink B. F., van Hulst F. N., Bolger B.

Kluwer Academic Publishers
9 Conference Proceedings Investigation On Laser-Induced Effects In Nanostructure Fabrication With Laser-Irradiated Scanning Tunneling Microscope Tips In Air Ambient

Mai, Z.H., Lu, Y.F., Song, W.D., Chim, W.K.

Materials Research Society
4 Conference Proceedings Enhancement of Raman scattering using silica microparticles

K. J. Yi, Y. F. Lu, H. Wang, Z. Y. Yang

SPIE - The International Society of Optical Engineering
10 Conference Proceedings Ultrahigh-density optical recording using a scanning near-field optical microscope

Lu,Y.Y., Tsai,D.P., Guo,W.R., Chen,S.-C., Liu,J.R., Shieh,H.P.D.

SPIE-The International Society for Optical Engineering
5 Conference Proceedings Near-field enhanced laser-assisted deposition

Shi, J., Lu, Y.F., Chen, X.Y., Cherukuri, R.S., Mendu, K.K., Batta, N.

SPIE - The International Society of Optical Engineering
11 Conference Proceedings Scanning near-field infrared microscope with a free-electron laser illumination source

Hong,M.K., Erramilli,S., Huie,P., James,G., Jeung,A.G.

SPIE-The International Society for Optical Engineering
6 Conference Proceedings Self-aligned Growth of Single-walled Carbon Nanotubes using Optical Near-field Effects

Yong Feng Lu, Y.S. Zhou, W. Xiong, M. Mahjouri-Samani, W.Q. Yang, K.J. Yi, X.N. He

Materials Research Society
12 Conference Proceedings Tip-sample distance control for near-field scanning optical microscopes

K. Karrat, R.D. Grober

Society of Photo-optical Instrumentation Engineers
1
 
2
 
3
 
4
 
5
 
6
 
7
 
8
 
9
 
10
 
11
 
12