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Fluorescence microscope using total internal reflection

Author(s):
  • S. J. Bae ( Korea Electrotechnology Research Institute, South Korea )
  • S. Y. Lee ( Korea Electrotechnology Research Institute, South Korea )
  • U. Knag ( Korea Electrotechnology Research Institute, South Korea )
Publication title:
Single molecule spectroscopy and imaging : 19-21 January 2008, San Jose, California, USA
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:
6862
Pub. Year:
2008
Page(from):
686210-1
Page(to):
686210-8
Pages:
8
Pub. info.:
Bellingham, Wash.: Society of Photo-optical Instrumentation Engineers
ISSN:
16057422
ISBN:
9780819470379 [0819470376]
Language:
English
Call no.:
P63600/6862
Type:
Conference Proceedings

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