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Confocal scanning microscopy with multiple optical probes for high speed measurements and better imaging

Author(s):
  • W. Chun ( Korea Advanced Institute of Science and Technology, South Korea )
  • S. Lee ( Korea Advanced Institute of Science and Technology, South Korea )
  • D.-G. Gweon ( Korea Advanced Institute of Science and Technology, South Korea )
Publication title:
Three-dimensional and multidimensional microscopy : image acquisition and processing XV : 21 and 23-24 January 2008, San Jose, California, USA
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:
6861
Pub. Year:
2008
Page(from):
686115-1
Page(to):
686115-10
Pages:
10
Pub. info.:
Bellingham, Wash.: Society of Photo-optical Instrumentation Engineers
ISSN:
16057422
ISBN:
9780819470362 [0819470368]
Language:
English
Call no.:
P63600/6861
Type:
Conference Proceedings

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