Blank Cover Image

Simulation of imaging with a theta line-scanning confocal microscope

Author(s):
Publication title:
Three-dimensional and multidimensional microscopy : image acquisition and processing XV : 21 and 23-24 January 2008, San Jose, California, USA
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:
6861
Pub. Year:
2008
Page(from):
68610V-1
Page(to):
68610V-11
Pages:
11
Pub. info.:
Bellingham, Wash.: Society of Photo-optical Instrumentation Engineers
ISSN:
16057422
ISBN:
9780819470362 [0819470368]
Language:
English
Call no.:
P63600/6861
Type:
Conference Proceedings

Similar Items:

Dwyer, P.J., DiMarzio, C.A., Fox, W.J., Zavislan, J.M., Rajadhyaksha, M.

SPIE - The International Society of Optical Engineering

C. Rembe, S. Boedecker, B. Armbruster, M. Bauer

SPIE - The International Society of Optical Engineering

S. Jung, C. Kim, S. Ju, Y. Cho, H. Jeong, B. Kim

SPIE - The International Society of Optical Engineering

Rembe, C., Drabenstedt, A.

SPIE - The International Society of Optical Engineering

W. C. Warger II, S. A. Guerrera, C. A. DiMarzio

SPIE - The International Society of Optical Engineering

9 Conference Proceedings Full-field quantitative phase imaging

C. A. DiMarzio

Society of Photo-optical Instrumentation Engineers

Nieva, A., Bouchard, M., DiMarzio, C.A.

SPIE - The International Society of Optical Engineering

Fu, S., Chia, T.C., Kwek, L.C., Diong, C.H., Tang, C.L., Choen, F.S., Krishnan, S.M.

SPIE-The International Society for Optical Engineering

Shimoji,M.

SPIE-The International Society for Optical Engineering

Garside,J.R., Somekh,M.G., See,C.W.

SPIE-The International Society for Optical Engineering

J.-C. Conchello, Q. Yu, J.W. Lichtman

Society of Photo-optical Instrumentation Engineers

DiMarzio, C. A.

SPIE - The International Society of Optical Engineering

1
 
2
 
3
 
4
 
5
 
6
 
7
 
8
 
9
 
10
 
11
 
12