Blank Cover Image

Imaging polarimetry of macular disease

Author(s):
Publication title:
Ophthalmic technologies XVIII : 19-21 January 2008, San Jose, California, USA
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:
6844
Pub. Year:
2008
Pt.:
A
Page(from):
68441D-1
Page(to):
68441D-4
Pages:
4
Pub. info.:
Bellingham, Wash.: Society of Photo-optical Instrumentation Engineers
ISSN:
16057422
ISBN:
9780819470195 [0819470198]
Language:
English
Call no.:
P63600/6844
Type:
Conference Proceedings

Similar Items:

M. Miura, M. Yamanari, A. E. Elsner, T. Yatagai, Y. Yasuno

SPIE - The International Society of Optical Engineering

7 Conference Proceedings Stokes polarimetry of biotissues

Ushenko,A.G., Burkovets,D.M., Yermolenko,S.B., Arkhelyuk,A.D., Pishak,V.P., Yuzko,A.M., Pishak,O.V., Plaviuk,L.A., …

SPIE - The International Society for Optical Engineering

2 Conference Proceedings Near-infrared imaging polarimetry

Goldstein,D.H., Chenault,D.B., Gulley,M.G., Spradley,K.D.

SPIE-The International Society for Optical Engineering

Kroeger,R.A., Johnson,W.N., Kinzer,R.L., Kurfess,J.D., Inderhees,S.E., Phlips,B.F., Graham,B.L.

SPIE-The International Society for Optical Engineering

C.E. Riva, B.L. Petrig, M.J. Mendel, S.D. Cranstoun

Society of Photo-optical Instrumentation Engineers

Saloner, D., Acevedo-bolton, G, Rayz, V, Wintermark, M, Martin, A, Dispensa, B, Young, W, Lawton, M, Rapp, J, Jou, L.-D

SPIE - The International Society of Optical Engineering

Smith,M.H., Woodruff,J.B., Howe,J.D.

SPIE - The International Society for Optical Engineering

Z. Cai, Q. Di, K. Chen, E. M. Reiman, L. Wang, K. Li, J. Tang, L. Yao, X. Zhao

SPIE - The International Society of Optical Engineering

Smith,M.H., Burke,P.D., Lompado,A., Tanner,E., Hillman,L.W.

SPIE - The International Society for Optical Engineering

Elsner,D.L., Whitaker,R.T., Abidi,M.A.

SPIE-The International Society for Optical Engineering

Wood, B. R., Bambery, K. R., Miller, L. M., Quinn, M., Chiriboga, L., Diem, M., McNaughton, D.

SPIE - The International Society of Optical Engineering

M. Haeker, M. Sonka, R. Kardon, V. A. Shah, X. Wu, M. D. Abramoff

SPIE - The International Society of Optical Engineering

1
 
2
 
3
 
4
 
5
 
6
 
7
 
8
 
9
 
10
 
11
 
12