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Charge accumulation in composite dielectric layers in capacitive RF MEMS switches

Author(s):
  • L. Zhan ( Xiamen Univ., China )
  • H. San ( Xiamen Univ., China )
  • G. Li ( Xiamen Univ., China )
  • P. Xu ( Xiamen Univ., China )
  • X. Chen ( Xiamen Univ., China )
Publication title:
MEMS/MOEMS technologies and applications III : 12-14 November 2007, Beijing, China
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:
6836
Pub. Year:
2008
Page(from):
68360Z-1
Page(to):
68360Z-8
Pages:
8
Pub. info.:
Bellingham, Wash.: Society of Photo-optical Instrumentation Engineers
ISSN:
0277786X
ISBN:
9780819470119 [0819470112]
Language:
English
Call no.:
P63600/6836
Type:
Conference Proceedings

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