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Measurement of self-organization pattern in dielectric barrier discharge by a special photoelectronic detection system

Author(s):
  • Z. Zhao ( Hebei Univ., China )
  • L. Dong ( Hebei Univ., China )
  • Y. Qi ( Hebei Univ., China )
  • Y. He ( Hebei Univ., China )
  • Y. Li ( Hebei Univ., China )
Publication title:
Optical Design and Testing III
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:
6834
Pub. Year:
2008
Vol.:
2
Page(from):
683425-1
Page(to):
683425-8
Pages:
8
Pub. info.:
Bellingham, Wash.: Society of Photo-optical Instrumentation Engineers
ISSN:
0277786X
ISBN:
9780819470096 [0819470090]
Language:
English
Call no.:
P63600/6834
Type:
Conference Proceedings

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