Research of light reflex surface defects detection technology

Research of light reflex surface defects detection technology

Author(s):

J. Tian ( Harbin Institute of Technology, China )
Y. Yao ( Harbin Institute of Technology, China )
Y. Sun ( Harbin Institute of Technology, China )
W. Shi ( Harbin Institute of Technology, China )
X. Zhao ( Harbin Institute of Technology, China )

Publication title:

Optical Design and Testing III

Title of ser.:

Proceedings of SPIE - the International Society for Optical Engineering

Ser. no.:

6834

Pub. Year:

2008

Vol.:

1

Page(from):

683418-1

Page(to):

683418-9

Pages:

9

Pub. info.:

Bellingham, Wash.: Society of Photo-optical Instrumentation Engineers

ISSN:

0277786X

ISBN:

9780819470096 [0819470090]

Language:

English

Call no.:

P63600/6834

Type:

Conference Proceedings

Details

TDL ID:	ZA00052465
Series ID:	PA00000029
Conf. info. (Name):	Photonics Asia : Optical Design and Testing
Conf. info. (Number):	2007 : 3rd
Conf. info. (Venue):	Beijing, China
Conf. info. (Date):	2007.11.12-2007.11.15
Note for article:	Optical Design and Testing III, 12-15 November 2007, Beijing, China - Session 10. Optical Measurement (683418/6834-118)

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