Research on the measuring technology of minute part's geometrical parameter based on image processing

Research on the measuring technology of minute part's geometrical parameter based on image processing

Author(s):

X. Jia ( Guilin Univ. of Electronic Technology, China )
Z. Xiao ( Guilin Univ. of Electronic Technology, China )

Publication title:

Electronic imaging and multimedia technology V

Title of ser.:

Proceedings of SPIE - the International Society for Optical Engineering

Ser. no.:

6833

Pub. Year:

2008

Vol.:

2

Page(from):

68332L-1

Page(to):

68332L-8

Pages:

8

Pub. info.:

Bellingham, Wash.: Society of Photo-optical Instrumentation Engineers

ISSN:

0277786X

ISBN:

9780819470089 [0819470082]

Language:

English

Call no.:

P63600/6833

Type:

Conference Proceedings

Details

TDL ID:	ZA00052464
Series ID:	PA00000029
Conf. info. (Name):	Photonics Asia : Electronic Imaging and Multimedia Technology
Conf. info. (Number):	2007 : 5th
Conf. info. (Venue):	Beijing, China
Conf. info. (Date):	2007.11.12-2007.11.15
Note for article:	Electronic imaging and multimedia technology V, 12-15 November 2007, Beijing, China - Poster Session (68332L/6833-79)

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