Blank Cover Image

Research on registration algorithm for check seal verification

Author(s):
  • S. Wang ( Tianjin Univ., China )
  • T. Liu ( Tianjin Univ., China )
Publication title:
Electronic imaging and multimedia technology V
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:
6833
Pub. Year:
2008
Vol.:
1
Page(from):
68330Y-1
Page(to):
68330Y-8
Pages:
8
Pub. info.:
Bellingham, Wash.: Society of Photo-optical Instrumentation Engineers
ISSN:
0277786X
ISBN:
9780819470089 [0819470082]
Language:
English
Call no.:
P63600/6833
Type:
Conference Proceedings

Similar Items:

J. He, T. Liu, Z. Zhang

Society of Photo-optical Instrumentation Engineers

Si, S., Wang, Y., Xu, J., Zhou, C., Gao, C.

SPIE-The International Society for Optical Engineering

Liu S,, Zhou X., Wang X.

SPIE - The International Society of Optical Engineering

T. Yao, D. Yin, Y. Liu

Society of Photo-optical Instrumentation Engineers

Li, X., Liu, Y., Wang, Y., Yan, D.

SPIE - The International Society of Optical Engineering

9 Conference Proceedings Novel algorithm for iris localization

Y. Wang, T. Liu, L. Liu

Society of Photo-optical Instrumentation Engineers

Y. Liu, H. Yang, L. Su, Y. Zhang, X. Rao

Society of Photo-optical Instrumentation Engineers

Li, T., Wang, M., Jian, S., Chen, Y., Cao, J., Cai, L., Zhao, J.

SPIE - The International Society of Optical Engineering

Liu, S., Zhou, X., Shen, T., Han, Y.

SPIE - The International Society of Optical Engineering

Liu, Y., Wang, Y.T., Chen, Y.

SPIE-The International Society for Optical Engineering

Li, Y., Liu, Y., Wang, Y.

SPIE - The International Society of Optical Engineering

Wang, C., Liu, Q., Zhang, L., Gao, G.-S., Brist, T. E., Donnelly, T., Shang, S.

SPIE - The International Society of Optical Engineering

1
 
2
 
3
 
4
 
5
 
6
 
7
 
8
 
9
 
10
 
11
 
12