Depth scanning with wavelength-stepped laser-diode interferometer
- Author(s):
- R. Onodera ( Univ. of Industrial Technology, Japan )
- Y. Ishii ( Tokyo Univ. of Science, Japan )
- Publication title:
- Advanced materials and devices for sensing and imaging III : 12-14 November 2007, Beijing, China
- Title of ser.:
- Proceedings of SPIE - the International Society for Optical Engineering
- Ser. no.:
- 6829
- Pub. Year:
- 2008
- Page(from):
- 682909-1
- Page(to):
- 682909-7
- Pages:
- 7
- Pub. info.:
- Bellingham, Wash.: Society of Photo-optical Instrumentation Engineers
- ISSN:
- 0277786X
- ISBN:
- 9780819470041 [081947004X]
- Language:
- English
- Call no.:
- P63600/6829
- Type:
- Conference Proceedings
Similar Items:
|
SPIE - The International Society for Optical Engineering |
7
Conference Proceedings
Selectively Interferometric Imaging with a Frequency-Modulated Laser Diode,
SPIE-The International Society for Optical Engineering |
|
2
Conference Proceedings
Laser diode phase-shifting interferometer insensitive to the changes in laser power
Society of Photo-optical Instrumentation Engineers |
SPIE-The International Society for Optical Engineering |
|
3
Conference Proceedings
Laser-diode phase-shifting interferometer with a high-speed camera (Invited Paper)
SPIE-The International Society for Optical Engineering |
SPIE-The International Society for Optical Engineering |
|
Society of Photo-optical Instrumentation Engineers |
SPIE - The International Society for Optical Engineering |
|
SPIE - The International Society for Optical Engineering |
11
Conference Proceedings
Phase-conjugate distance measurement interferometer with frequency modulation of a laser diode
SPIE-The International Society for Optical Engineering |
|
6
Conference Proceedings
Phase-shifting interferometer for distance measurement using a tunable external-cavity laser diode
SPIE - The International Society for Optical Engineering |
12
Conference Proceedings
Wavelength-shifting interferometry by a wide tunable laser source with a new phase-shifting technique
SPIE - The International Society of Optical Engineering |