Blank Cover Image

Analysis of circuit model for vertical-cavity surface-emitting lasers

Author(s):
W. Wu ( China Jiliang Univ., China )  
Publication title:
Semiconductor lasers and applications III : 12-13 November 2007, Beijing, China
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:
6824
Pub. Year:
2008
Page(from):
68241J-1
Page(to):
68241J-5
Pages:
5
Pub. info.:
Bellingham, Wash.: Society of Photo-optical Instrumentation Engineers
ISSN:
0277786X
ISBN:
9780819469991 [0819469998]
Language:
English
Call no.:
P63600/6824
Type:
Conference Proceedings

Similar Items:

Pan, W., Zhang, X., Luo, B.

SPIE-The International Society for Optical Engineering

Nakwaski,W.

SPIE-The International Society for Optical Engineering

Vey,J.-L.C., Auen,K., ElsaSer,W.E.

SPIE-The International Society for Optical Engineering

Robert W. Herrick

Materials Research Society

G.R. Hadley, K.L. Lear, M.E. Warren, K.D. Choquette, J.W. Scott

Society of Photo-optical Instrumentation Engineers

Zakharov, S.M., Manykin, E.A.

SPIE-The International Society for Optical Engineering

Mackowiak,P., Nakwaski,W.

SPIE-The International Society for Optical Engineering

R. P. Sarzala, W. Nakwaski

SPIE - The International Society of Optical Engineering

Vurgaftman, I., Bewley, W. W., Felix, C. L., Aifer, E. H., Meyer, J. R., Goldberg, L., Chow, D. H., Selvig, E.

MRS - Materials Research Society

Logginov, A. S., Rzhanov, A. G., Skorov, D. V.

SPIE - The International Society of Optical Engineering

Liu, W., Lin, S., Wu, S., Cheng, P., Zhang, C.

SPIE-The International Society for Optical Engineering

R. Michalzik, K.J. Ebeling

Society of Photo-optical Instrumentation Engineers

1
 
2
 
3
 
4
 
5
 
6
 
7
 
8
 
9
 
10
 
11
 
12