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Profile based fast noise estimation and high ISO noise reduction for digital cameras

Author(s):
  • Y. Yoo ( Samsung Advanced Institute of Technology, South Korea )
  • H. Wey ( Samsung Advanced Institute of Technology, South Korea )
  • S. Lee ( Samsung Advanced Institute of Technology, South Korea )
  • C.-Y. Kim ( Samsung Advanced Institute of Technology, South Korea )
Publication title:
Digital photography IV : 28-29 January 2008, San Jose, California, USA
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:
6817
Pub. Year:
2008
Page(from):
68170B-1
Page(to):
68170B-12
Pages:
12
Pub. info.:
Bellingham, Wash.: Society of Photo-optical Instrumentation Engineers
ISSN:
0277786X
ISBN:
9780819469892 [0819469890]
Language:
English
Call no.:
P63600/6817
Type:
Conference Proceedings

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