An optimum design of the LOFIC CMOS image sensor for high sensitivity, low noise, and high full well capacity

An optimum design of the LOFIC CMOS image sensor for high sensitivity, low noise, and high full well capacity

Author(s):

N. Akahane ( Tohoku Univ., Japan )
W. Lee ( Tohoku Univ., Japan )
S. Sugawa ( Tohoku Univ., Japan )

Publication title:

Digital photography IV : 28-29 January 2008, San Jose, California, USA

Title of ser.:

Proceedings of SPIE - the International Society for Optical Engineering

Ser. no.:

6817

Pub. Year:

2008

Page(from):

681702-1

Page(to):

681702-8

Pages:

8

Pub. info.:

Bellingham, Wash.: Society of Photo-optical Instrumentation Engineers

ISSN:

0277786X

ISBN:

9780819469892 [0819469890]

Language:

English

Call no.:

P63600/6817

Type:

Conference Proceedings

Details

TDL ID:	ZA00052448
Series ID:	PA00000029
Conf. info. (Name):	IS&T/SPIE Electronic Imaging : Digital Photography
Conf. info. (Number):	2008 : 4th
Conf. info. (Venue):	San Jose, California, USA
Conf. info. (Date):	2008.01.28-2008.01.29
Note for article:	Digital photography IV, 28-29 January 2008, San Jose, California, USA - Session 1. Sensor Design (6817-01)

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