Blank Cover Image

Directional filter banks for detecting un-patterned TFT-LCD defect

Author(s):
  • N. K. Park ( Seoul National Univ., South Korea )
  • H. W. Kim ( Seoul National Univ., South Korea )
  • S. I. Yoo ( Seoul National Univ., South Korea )
Publication title:
Image processing : machine vision applications : 29-31 January 2008, San Jose, California, USA
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:
6813
Pub. Year:
2008
Page(from):
68130U-1
Page(to):
68130U-9
Pages:
9
Pub. info.:
Bellingham, Wash.: Society of Photo-optical Instrumentation Engineers
ISSN:
0277786X
ISBN:
9780819469854 [0819469858]
Language:
English
Call no.:
P63600/6813
Type:
Conference Proceedings

Similar Items:

1 Conference Proceedings Non referential method for defects inspection of TFT-LCD pad

H. W. Kim, S. I. Yoo

Society of Photo-optical Instrumentation Engineers
7 Conference Proceedings Low-Temperature Polycrystalline Si TFTs Fabricated With Directionally Crystallized Si Film

Jung, Y.H., Yoon, J.M., Yang, M.S., Park, W.K., Soh, H.S., Cho, H.S., Limanov, A.B., Im, J.S.

Materials Research Society
2 Conference Proceedings Area-mura detection in TFT-LCD panel

Choi, K.N., Lee, J.Y., Yoo, S.I.

SPIE - The International Society of Optical Engineering
8 Conference Proceedings Full-color reflective-type TFT-LCD

Ting,D.-L., Chen,C.-L., Kuo,C.-L., Wei,C.-K., Liu,C.-Y., Lu,Y.-H., Shih,H.-F., Hao,C.-W., Wu,S.-T.

SPIE-The International Society for Optical Engineering
3 Conference Proceedings Aerial image characterization for the defects in the extreme ultraviolet mask

Yoo, M.-S., Park, S.-W., Kim, J.-H., Kwon, Y.-K., Oh, H.-K.

SPIE - The International Society of Optical Engineering
9 Conference Proceedings Detectability and printability of programmed defect reticle for 256-Mb dram

Park,J.H., Cho,H.-K., Kim,Y.-H., Lee,K.-H., Yoon,H.-S.

SPIE-The International Society for Optical Engineering
4 Conference Proceedings Study on an inspection method of repeated pattern: automatic pattern inspection for TFT LCD

Lim, D.C., Yun, S.-Y., Jeong, D.H., Hong, C.-K.

SPIE-The International Society for Optical Engineering
10 Conference Proceedings Low Temperature Poly-Si TFT-LCDs Using P-type Technology

Kim, K.-J., Ha, Y.-M., Yeo, J.-C., Kim, B.-K., Choi, H-S., Kim, D.-G.

Electrochemical Society
5 Conference Proceedings Evaluation of litho printability of DRAM contact hole patterns with various programmed defects

K. Seo, S. Lee, H. Kim, D. Hwang, S. Kim, G. Jeong, O. Han, C. Chen, D. Yee, E. Kim, K. Park, N. Kim, S. Choi, D. Kim, …

SPIE - The International Society of Optical Engineering
11 Conference Proceedings Low Temperature Poly-Si TFT Technology

Noguchi, T., Kim, D.Y., Kwon, J.Y., Park, K.B., Jung, J.S., Xianyu, W.X., Yin, H.X., Cho, H.S.

Materials Research Society
6 Conference Proceedings The Dependence of Phase Separation of PDLC on the Sample Preparation Conditions of TFT LCD Panel

Noh, C. H., Park, K. S., Sakong, D. S.

MRS - Materials Research Society
12 Conference Proceedings KrF attenuated PSM defect printability and detectability for 120-nm actual DRAM patterning process

Kim,J., Kim,S.-C., Kim,H.-C., Lee,S.-I., Choi,Y.-K., Ham,Y.-M., Han,O.

SPIE-The International Society for Optical Engineering
1
 
2
 
3
 
4
 
5
 
6
 
7
 
8
 
9
 
10
 
11
 
12