Printer resolution measurement based on slanted edge method

Printer resolution measurement based on slanted edge method

Author(s):

Y. Bang ( Samsung Electronics Co. Ltd., South Korea )
S. H. Kim ( Samsung Electronics Co. Ltd., South Korea )
D. C. Choi ( Samsung Electronics Co. Ltd., South Korea )

Publication title:

Image quality and system performance V : 28-30 January 2008, San Jose, California, USA

Title of ser.:

Proceedings of SPIE - the International Society for Optical Engineering

Ser. no.:

6808

Pub. Year:

2008

Page(from):

680807-1

Page(to):

680807-8

Pub. info.:

Bellingham, Wash.: Society of Photo-optical Instrumentation Engineers

ISSN:

0277786X

ISBN:

9780819469809 [0819469807]

Language:

English

Call no.:

P63600/6808

Type:

Conference Proceedings

Details

TDL ID:	ZA00052439
Series ID:	PA00000029
Conf. info. (Name):	IS&T/SPIE Electronic Imaging : Image Quality and System Performance
Conf. info. (Number):	2008 : 5th
Conf. info. (Venue):	San Jose, California, USA
Conf. info. (Date):	2008.01.28-2008.01.30
Note for article:	Image quality and system performance V, 28-30 January 2008, San Jose, California, USA - Session 2. Image Quality Attributes Characterization and Measurement: Printer (6808-06)

Similar Items:

1 Conference Proceedings Measurement-based objective metric for printer resolution J. Hasegawa, T. Hwang, H. Kim, D. Kim, M. Choi SPIE - The International Society of Optical Engineering	7 Conference Proceedings Rapid bio-patterning method based on the fabrication of PEG microstructures and layer-by-layer polymeric thin film H. -W. Shim, J. -H. Lee, C. -H. Choi, H. -M. Song, B. -Y. Kim, D. -P. Kim, C. -S. Lee SPIE - The International Society of Optical Engineering
2 Conference Proceedings MTF assessment of high resolution satellite images using ISO 12233 slanted-edge method H. Hwang, Y.-W. Choi, S. Kwak, M. Kim, W. Park Society of Photo-optical Instrumentation Engineers	8 Conference Proceedings A novel color mapping method for preferred color reproduction K. M. Kim, H. S. Oh, S. H. Kim, D. C. Choi SPIE - The International Society of Optical Engineering
3 Conference Proceedings Application of Tatian's method to slanted-edge MTF measurement Burns, P. D. SPIE - The International Society of Optical Engineering	9 Conference Proceedings Effect of clear field ratio on critical dimension in the dry etching process Lee,C.-J., Bang,H.-S., Choi,J.-W., Jung,H.-S., Shin,C., Kim,H.-S. SPIE-The International Society for Optical Engineering
4 Conference Proceedings Model-based error-diffusion method for tone linearity correction in binary printers Kim,J.H., Lee,E.H., Kim,Y.S. SPIE-The International Society for Optical Engineering	10 Conference Proceedings Impact monitoring in smart composites using stabilization-controlled FBG sensor system Bang, H.-J., Park, S.-W., Kim, D.-H., Hong, C.-S., Kim, C.-G. SPIE - The International Society of Optical Engineering
5 Conference Proceedings A scalable SIMD digital signal processor for high-quality multifunctional printer systems Kang, H. -J., Choi, Y., Kim, K., Park, I. -C., Kim, J. -W., Lee, E. -H., Gahang, G. -S. SPIE - The International Society of Optical Engineering	11 Conference Proceedings Gamut mapping method for ICC saturated intent M. Cho, H. Choh, S. Kim, Y. Kim, Y. Bang SPIE - The International Society of Optical Engineering
6 Conference Proceedings A measurement system based on visual servoing and error correction method using multiple CCD camera module and structured target for three dimensional … D.-K. Noh, S.-H. Kim, Y.-J. Park, D. J. Choi Society of Photo-optical Instrumentation Engineers	12 Conference Proceedings Measurement of the spatial frequency response(SFR)of digital still-picture cameras using a modified slanted-edge method Hsu,W.-F., Hsu,Y.-C., Chuang,K.-W. SPIE - The International Society for Optical Engineering

1

2

3

4

5

6

7

8

9

10

11

12