Using quality metrics with laser range scanners

Using quality metrics with laser range scanners

Author(s):

D. Mackinnon ( Carleton Univ., Canada )
V. Aitken ( Carlton Univ., Canada )
F. Blais ( National Research Council Canada, Canada )

Publication title:

Three-dimensional image capture and applications 2008 : 28-29 January, 2008, San Jose, California, USA

Title of ser.:

Proceedings of SPIE - the International Society for Optical Engineering

Ser. no.:

6805

Pub. Year:

2008

Page(from):

68050G-1

Page(to):

68050G-12

Pages:

12

Pub. info.:

Bellingham, Wash.: Society of Photo-optical Instrumentation Engineers

ISSN:

0277786X

ISBN:

9780819469779 [0819469777]

Language:

English

Call no.:

P63600/6805

Type:

Conference Proceedings

Details

TDL ID:	ZA00052436
Series ID:	PA00000029
Conf. info. (Name):	IS&T/SPIE Electronic Imaging : Three-Dimensional Image Capture and Applications
Conf. info. (Number):	2008
Conf. info. (Venue):	San Jose, California, USA
Conf. info. (Date):	2008.01.28-2008.01.29
Note for article:	Three-dimensional image capture and applications 2008, 28-29 January 2008, San Jose, California, USA - Session 4. 3D Data Processing and Algorithms II (6805-16)

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