SoC variability evaluation and reduction
- Author(s):
- A. P. Balasinski ( Cypress Semiconductor, USA )
- M. C. Smayling ( Tela innovations, Inc., USA )
- V. Axelrad ( Sequoia Design Systems, Inc., USA )
- Publication title:
- Microelectronics : design, technology, and packaging III : 5-7 December 2007, Canberra, Australia
- Title of ser.:
- Proceedings of SPIE - the International Society for Optical Engineering
- Ser. no.:
- 6798
- Pub. Year:
- 2008
- Page(from):
- 67980I-1
- Page(to):
- 67980I-8
- Pages:
- 8
- Pub. info.:
- Bellingham, Wash.: Society of Photo-optical Instrumentation Engineers
- ISSN:
- 0277786X
- ISBN:
- 9780819469694 [0819469696]
- Language:
- English
- Call no.:
- P63600/6798
- Type:
- Conference Proceedings
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