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Research of elliptical curved crystal spectrometer for measuring laser-produced plasma x-ray

Author(s):
  • G. Zhu ( Chongqing Institute of Technology, China )
  • X. Zhong ( Chongqing Univ., China )
  • X. Xiong ( Chongqing Univ., China )
  • W. Feng ( Chongqing Institute of Technology, China )
Publication title:
ICMIT 2007, mechatronics, MEMS, and smart materials
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:
6794
Pub. Year:
2008
Vol.:
1
Page(from):
67941W-1
Page(to):
67941W-6
Pages:
6
Pub. info.:
Bellingham, Wash.: Society of Photo-optical Instrumentation Engineers
ISSN:
0277786X
ISBN:
9780819469595 [0819469599]
Language:
English
Call no.:
P63600/6794
Type:
Conference Proceedings

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