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Pattern recognition for MEMS images of surface topography using wavelets

Author(s):
  • K. Hu ( Huazhong Univ. of Science and Technology, China )
  • X. Jiang ( Huazhong Univ. of Science and Technology, China )
  • X. Liu ( Huazhong Univ. of Science and Technology, China )
Publication title:
MIPPR 2007
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:
6790
Pub. Year:
2007
Vol.:
2
Page(from):
67905B-1
Page(to):
67905B-5
Pages:
5
Pub. info.:
Bellingham, Wash.: Society of Photo-optical Instrumentation Engineers
ISSN:
0277786X
ISBN:
9780819469540 [0819469548]
Language:
English
Call no.:
P63600/6790
Type:
Conference Proceedings

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