Blank Cover Image

Accuracy improvement for 3D shape measurement system based on gray-code and phase-shift structured light projection

Author(s):
  • X. Chen ( Shanghai Jiao Tong Univ., China )
  • J. Xi ( Shanghai Jiao Tong Univ., China )
  • Y. Jin ( Shanghai Jiao Tong Univ., China )
  • B. Xu ( Shanghai Jiao Tong Univ., China )
Publication title:
MIPPR 2007 : pattern recognition and computer vision : 15-17 November 2007, Wuhan, China
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:
6788
Pub. Year:
2007
Page(from):
67882C-1
Page(to):
67882C-9
Pages:
9
Pub. info.:
Bellingham, Wash.: Society of Photo-optical Instrumentation Engineers
ISSN:
0277786X
ISBN:
9780819469526 [0819469521]
Language:
English
Call no.:
P63600/6788
Type:
Conference Proceedings

Similar Items:

1 Conference Proceedings Development and characterization of a 3D measuring system based on integration of gray code and phase-shift light projection

Sansoni,G., Lazzari,S., Carocci,M., Docchio,F.

SPIE-The International Society for Optical Engineering
7 Conference Proceedings 3D Antenna Measurement System - Low Gain Antenna Measurements and CTIA OTA Testing

D. J. Gray

ESA Publications Division
2 Conference Proceedings Fast 3D shape measurement based on color structure light projection

Wegiel, M.G., Kujawinska, M.

SPIE-The International Society for Optical Engineering
8 Conference Proceedings Study on improvement of resolution in photolithographic patterns with pupil phase-shift filtering

Chen, X., Shi, J., Luo, X., Kang, X., Qin, T.

SPIE - The International Society of Optical Engineering
3 Conference Proceedings Innovative application of the RCWA method for the ultra-sensitive transmittance-based CD measurements on phase-shift masks

A. Gray, J. C. Lam, S. Chen

SPIE - The International Society of Optical Engineering
9 Conference Proceedings 3D shape measurement with phase correlation based fringe projection

P. Kuehmstedt, C. Munckelt, M. Heinze, C. Braeuer-Burchardt, G. Notni

SPIE - The International Society of Optical Engineering
4 Conference Proceedings Novel technique for critical dimension measurements of phase-shift masks using broadband transmittance spectra in conjunction with RCWA [6349-162]

Gray, A., Lam, J. C., Chen, S.

SPIE - The International Society of Optical Engineering
10 Conference Proceedings Accuracy problems in phase shift based 3D machine vision inspection systems

I. Dunin-Barkowski, J.-S. Kim

SPIE - The International Society of Optical Engineering
5 Conference Proceedings Influence of the projected grid pattern distortions on measurement accuracy for phase shift base 3D inspection [6051-27]

Dunin-Barkowski I., Kim J.-S

SPIE - The International Society of Optical Engineering
11 Conference Proceedings Study on the characteristics of the λ/4 phase-shift DFB Yb3+-doped fiber lasers

Chen, J., Chen, B., Feng, X., Wang, L., Lin, Z.

SPIE - The International Society of Optical Engineering
6 Conference Proceedings Phase error compensation for a 3D shape measurement system based on the phase- shifting method [6000-14]

Zhang, S., Huang, P.S.

SPIE - The International Society of Optical Engineering
12 Conference Proceedings Deformation and 3D-shape measurement system based on phase-shifting digital holography

Lai,S.C., Kolenovic,E., Osten,W., Juptner,W.

SPIE-The International Society for Optical Engineering
1
 
2
 
3
 
4
 
5
 
6
 
7
 
8
 
9
 
10
 
11
 
12