Classification of lunar soil from reflectance spectrum by PCA and SVM
- Author(s):
- Publication title:
- MIPPR 2007 : pattern recognition and computer vision : 15-17 November 2007, Wuhan, China
- Title of ser.:
- Proceedings of SPIE - the International Society for Optical Engineering
- Ser. no.:
- 6788
- Pub. Year:
- 2007
- Page(from):
- 678817-1
- Page(to):
- 678817-8
- Pages:
- 8
- Pub. info.:
- Bellingham, Wash.: Society of Photo-optical Instrumentation Engineers
- ISSN:
- 0277786X
- ISBN:
- 9780819469526 [0819469521]
- Language:
- English
- Call no.:
- P63600/6788
- Type:
- Conference Proceedings
Similar Items:
SPIE - The International Society of Optical Engineering |
7
Conference Proceedings
Detecting citrus canker by hyperspectral reflectance imaging and PCA-based image classification method
Society of Photo-optical Instrumentation Engineers |
2
Conference Proceedings
Estimation of soil moisture with hyperspectral reflectance based on ground-based remote sensing
SPIE - The International Society of Optical Engineering |
8
Conference Proceedings
Investigation of crop growth condition with hyperspectral reflectance based on ground-based remote sensing
SPIE - The International Society of Optical Engineering |
Society of Photo-optical Instrumentation Engineers |
9
Conference Proceedings
The study on the near infrared spectrum technology of sauce component analysis [6027-162]
SPIE - The International Society of Optical Engineering |
4
Conference Proceedings
Reflected spectrum nonreciprocity in a uniform periodic fiber Bragg grating
SPIE-The International Society for Optical Engineering |
10
Conference Proceedings
Accuracy of PCA-NN in non-invasively determining tissue optical properties from spatially resolved diffuse reflectance
SPIE - The International Society of Optical Engineering |
SPIE - The International Society of Optical Engineering |
11
Conference Proceedings
Polarimetric SAR Image Classification Based on SVM Classifier Using Radarsat-2 Quad-Pol Data
ESA Communications |
SPIE-The International Society for Optical Engineering |
SPIE-The International Society for Optical Engineering |