Blank Cover Image

Subbands threshold effect factors and second version contourlet transform based image denoising method

Author(s):
  • X. Chen ( Huazhong Univ. of Science and Technology, China )
  • W. Liu ( Huazhong Univ. of Science and Technology, China )
  • J. Tian ( Huazhong Univ. of Science and Technology, China )
  • X. Shen ( Huazhong Univ. of Science and Technology, China )
Publication title:
MIPPR 2007 : multispectral image processing : 15-17 November 2007, Wuhan, China
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:
6787
Pub. Year:
2007
Page(from):
67870Z-1
Page(to):
67870Z-8
Pages:
8
Pub. info.:
Bellingham, Wash.: Society of Photo-optical Instrumentation Engineers
ISSN:
0277786X
ISBN:
9780819469519 [0819469513]
Language:
English
Call no.:
P63600/6787
Type:
Conference Proceedings

Similar Items:

X. Zhang, J. Li, Z. Yi, W. Yang

Society of Photo-optical Instrumentation Engineers

Y. Gu, Y. Guo, X. Liu, Y. Zhang

Society of Photo-optical Instrumentation Engineers

Y. Lin, X. Zhou, L. Song, Y. Huang

Society of Photo-optical Instrumentation Engineers

Liu, S., Zhou, X., Shen, T., Han, Y.

SPIE - The International Society of Optical Engineering

Tao, H., Tang, X., Liu, J., Tian, J.

SPIE-The International Society for Optical Engineering

Tao, H., Tang, X., Liu, J., Tian, J.

SPIE-The International Society for Optical Engineering

X. Xu, X. Zhang, D. Zhang

Society of Photo-optical Instrumentation Engineers

X. Yan, J. Yang, Z. Liu, L. Yuan

Society of Photo-optical Instrumentation Engineers

Hou J., tian J., Lui J.

SPIE - The International Society of Optical Engineering

X. Liu, X. Peng, Y. Yin, J. Tian, A. Li

Society of Photo-optical Instrumentation Engineers

J. Li, X. Zhang, K. Li, X. Li

Society of Photo-optical Instrumentation Engineers

Tian,J., Liu,B., Liu,J.

SPIE - The International Society for Optical Engineering

1
 
2
 
3
 
4
 
5
 
6
 
7
 
8
 
9
 
10
 
11
 
12