Blank Cover Image

Blind image restoration based on a new wavelet edge detection

Author(s):
  • H. Wang ( Changchun Univ. of Technology, China )
  • J. Guo ( Changchun Univ. of Technology, China )
  • L. Liu ( Changchun Univ. of Technology, China )
Publication title:
MIPPR 2007 : multispectral image processing : 15-17 November 2007, Wuhan, China
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:
6787
Pub. Year:
2007
Page(from):
67870P-1
Page(to):
67870P-5
Pages:
5
Pub. info.:
Bellingham, Wash.: Society of Photo-optical Instrumentation Engineers
ISSN:
0277786X
ISBN:
9780819469519 [0819469513]
Language:
English
Call no.:
P63600/6787
Type:
Conference Proceedings

Similar Items:

Zhang, J., Ni, G., Liu, M., Gui, X., Liu, X.

SPIE - The International Society of Optical Engineering

Wang, D., Chang, J., Liu, H., Guo, H., Tao, S.

SPIE - The International Society of Optical Engineering

Guo, P., Xing, L.

SPIE - The International Society of Optical Engineering

Liu, M., Liu, G., Xiu, J., Kuang, H., Zhai, L.

SPIE - The International Society of Optical Engineering

Li, H.G., Wang, J.

SPIE-The International Society for Optical Engineering

H. Hong, T. Zhang, J. Yu

Society of Photo-optical Instrumentation Engineers

L. Chen, X. Chen, P. Guo

Society of Photo-optical Instrumentation Engineers

Wang,H.-J.M., Su,P.-C., Kuo,C.-C.J.

SPIE - The International Society for Optical Engineering

Li, H., Guo, L., Liu, H.

SPIE - The International Society of Optical Engineering

Wang, L.J., Liu, Q., Wang, T., Zheng, Y.

SPIE - The International Society of Optical Engineering

Yi S., Cao H., Li X., Liu M.

SPIE - The International Society of Optical Engineering

Y. Liu, S. Qin

Society of Photo-optical Instrumentation Engineers

1
 
2
 
3
 
4
 
5
 
6
 
7
 
8
 
9
 
10
 
11
 
12