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Time-of-flight 3D localization of fluorescent inclusions in thick turbid media with ultra-fast TCSPC APDs and electronics

Author(s):
Publication title:
Advanced photon counting techniques II : 9-11 September 2007, Boston, Massachusetts, USA
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:
6771
Pub. Year:
2007
Page(from):
677107-1
Page(to):
677107-8
Pages:
8
Pub. info.:
Bellingham, Wash.: Society of Photo-optical Instrumentation Engineers
ISSN:
0277786X
ISBN:
9780819469311 [0819469319]
Language:
English
Call no.:
P63600/6771
Type:
Conference Proceedings

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