Blank Cover Image

Indexes for assessing the spectral range more sensitive to the detection of the buried structures

Author(s):
  • A. Palombo ( Institute of Methodologies for Environmental Analysis, Italy )
  • R. M. Cavalli ( Institute for Atmospheric Pollution, Italy )
  • L. Fusilli ( Institute for Atmospheric Pollution, Italy )
  • S. Pascucci ( Institute for Atmospheric Pollution, Italy )
  • F. Santini ( Institute for Atmospheric Pollution, Italy )
Publication title:
Remote sensing for environmental monitoring, GIS applications, and geology VII : 17-20 September 2007, Florence, Italy
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:
6749
Pub. Year:
2007
Page(from):
67492Z-1
Page(to):
67492Z-8
Pages:
8
Pub. info.:
Bellingham, Wash.: Society of Photo-optical Instrumentation Engineers
ISSN:
0277786X
ISBN:
9780819469076 [0819469076]
Language:
English
Call no.:
P63600/6749
Type:
Conference Proceedings

Similar Items:

R. M. Cavalli, G. Laneve, S. Pignatti, F. Santini

ESA Publications Division

S. Pascucci, C. Bassani, R.M. Cavalli

ESA Communications

F. Santini, R. M. Cavalli, A. PalomPo, S. Pignatti

Society of Photo-optical Instrumentation Engineers

L. Fusilli, C. Bassani, S. Pascucci, S. Pignatti

Society of Photo-optical Instrumentation Engineers

C. Bassani, R. M. Cavalli, S. Pignatti, F. Santini

Society of Photo-optical Instrumentation Engineers

R. Bianchi, R.M. Cavalli, C.M. Marino, S. Pignatti, M. Poscolieri

Society of Photo-optical Instrumentation Engineers

G. Laneve, R.M. Cavalli, L. Fusilli

ESA Communications

Detsch,R.M., Jenkins,T.F., Arcone,S.A., Koh,G., O'Neill,K.

SPIE-The International Society for Optical Engineering

Pearton, S.J., Ren, F., D'asaro, L.A., Hobson, W.S., Fullowan, T.R., Lothian, J., Abernathy, C.R., Kopf, R.F., Kuo, …

Materials Research Society

S. Pascucci, C. Bassani, L. Fusilli, A. Paiombo

Society of Photo-optical Instrumentation Engineers

Louis, E., Van de Kruijs, R. W. E, Yakshin, A. E., Van der Westen, S. A, Bijkerk, F., Van Herpen, M. M. J. W., Klunder, …

SPIE - The International Society of Optical Engineering

1
 
2
 
3
 
4
 
5
 
6
 
7
 
8
 
9
 
10
 
11
 
12